Angstrom Scientific Inc. represents the leading manufacturers supporting materials characterization. Specifically: Hitachi Tabletop SEMs, Imina Nano-probing systems, Point Electronics EBIC/EBAC, Leica Sample prep equipment, NenoVision and Alemnis In-Situ AFM, & Nano-Indenters, EMSIS TEM Cameras, Advent Diamond X-ray Beam Monitor, ConnectomX – Katana Microtome, VacuumFab motion control and Noble Dome Air-Free Transfer System. Additionally, Angstrom Scientific provides field services, contract testing, and general technical support.