TESCAN Launches AMBER 2

TESCAN launches advanced TESCAN AMBER 2 at M&M Expo 2024

TESCAN, a leading provider of scientific instrumentation, proudly introduces the TESCAN AMBER 2, the fourth generation of its gallium FIB-SEM platform, at the Microscopy & Microanalysis (M&M) Expo 2024. Building on the success of its predecessor, the AMBER 2 features enhanced automation and usability, setting new standards in TEM/STEM sample preparation and nanoprototyping.

Key Innovations Unveiled Alongside AMBER 2

In addition to AMBER 2, TESCAN reveals two groundbreaking tools: the AURA Gentle Ion Beam system, designed to minimize gallium FIB-induced damage in TEM specimen preparation, and the TEM AutoPrep Pro™ software, which automates and optimizes the entire TEM sample preparation process.

Advancements in TESCAN AMBER 2

The original AMBER, launched in 2019, revolutionized materials nanocharacterization with its ultra-high-resolution SEM and advanced Ga+ FIB. The AMBER 2 elevates these capabilities with enhanced automation, streamlining operations for precise and efficient sample preparation and 3D analysis. Key features include:

• Enhanced Automation: Fully automated processes reduce user intervention, maximizing efficiency.
• User-Friendly Interface: Designed for both beginners and advanced users, offering an intuitive experience.
• Overnight Operation: Enables automated tasks to be performed overnight, significantly boosting lab productivity.
• Precise Sample Preparation: Maintains high resolution and accuracy in sample preparation and imaging.
• Optimized Prototyping: Expands possibilities for advanced prototyping techniques, including electron beam lithography.

AI-Driven Technology and Advanced Features

The AMBER 2 leverages an AI-driven approach and an extensive material library to ensure reliable, fully automated sample preparation across various materials. The integration of a beam blanker on the new generation BrightBeam™ SEM column further enhances nanoprototyping capabilities. This makes the AMBER 2 an excellent choice for those seeking to perform FIB-SEM characterization from micron scale to the nanoscale.

TESCAN AMBER 2 sets a new benchmark in scientific instrumentation, perfecting TEM/STEM sample preparation and nanoprototyping, while increasing productivity and efficiency for laboratories.

This article is a summary of a published press release