AMBER x 2 Delivers Advancements in Plasma FIB Technology

TESCAN, in collaboration with Orsay Physics, has launched the AMBER X 2, an advanced plasma FIB-SEM system designed to revolutionize materials science research. With unmatched resolution, throughput, and versatility, the AMBER X 2 offers a comprehensive solution for sample preparation and characterization. Leveraging Orsay Physics' plasma FIB-SEM expertise, it enhances precision and automation for TEM/STEM specimen preparation, coupled with efficient milling capabilities.

Key features include the MISTRAL Plasma FIB Column™ for optimized beam profiles and precision, TEM AutoPrep Pro™ for fully automated TEM sample preparation, and a field-free UHR-SEM column for high-resolution imaging. Additionally, its multimodal and multiscale analysis supports advanced 3D techniques like 3D ToF-SIMS, crucial for applications like next-generation battery research.

As Martin Slama, Product Marketing Manager for the AMBER X 2, explains, this system sets new standards in high-resolution, high-throughput characterization, disrupting the dominance of Gallium FIB-SEMs in materials science labs.