The Tescan MIRA 3 LM is a Schottky field-emission scanning electron microscope equipped with four 30 mm squared silicon x-ray drift detectors. It has been automated for particle and generic imaging and X-ray acquisition tasks.
Key features and capabilities include:
- High X-ray throughput: The microscope is optimized for high X-ray throughput, achieving 200 counts per second at 1 nA on copper at 20 keV.
- Low noise imaging: The Tescan MIRA 3 LM is designed for low noise imaging.
- Custom sizing algorithms: The microscope uses custom sizing algorithms to facilitate state-of-the-art particle analysis.
- Python scripting: The instrument is scriptable in Python using the SEMantics framework, an instrument control extension to NIST DTSA-II.
- High throughput: On optimal samples, you can achieve throughputs of up to 10,000 particles per hour.
- Elemental sensitivity: The microscope offers sensitivity down to about 1% for most elements.
The Tescan MIRA 3 LM has been used for various applications including studying environmental particles, forensics, large area x-ray spectrum imaging, and more.
