TESCAN AMBER X2

The TESCAN AMBER X 2 is a plasma-focused ion beam scanning electron microscope (FIB-SEM) system developed in collaboration with Orsay Physics, specifically designed for advanced materials science research. It features the MISTRAL Plasma FIB Column™, engineered to optimize ion beam parameters for improved beam placement accuracy and milling performance, even at low ion beam energies. This technology allows for precise control in sample preparation, especially for TEM/STEM applications, by increasing milling efficiency.

The TEM AutoPrep Pro™ provides a fully automated workflow for preparing TEM samples, enhancing both speed and accuracy. With the system's field-free ultra-high-resolution (UHR) SEM column, users can achieve high-resolution imaging across a wide range of materials without the constraints of immersion optics, offering a broader field of view and multiple scanning modes. This flexibility allows for detailed, high-precision analysis of material samples.

A key advantage of the AMBER X 2 is its multimodal and multiscale characterization capabilities, including the ability to perform 3D ToF-SIMS analysis, which is essential for analyzing elemental compositions in materials research, such as in the study of next-generation battery technologies. The integration of these technologies makes the AMBER X 2 suitable for applications requiring both high-resolution imaging and precise sample preparation.

This system represents a shift from traditional Gallium-based FIB-SEMs, offering a plasma FIB alternative that enhances throughput and precision for researchers.