TESCAN AMBER 2

TESCAN introduces the AMBER 2, the latest generation of its gallium FIB-SEM platform, launched at the Microscopy & Microanalysis (M&M) Expo 2024. The AMBER 2 offers significant improvements in automation and usability, building on the original AMBER released in 2019.

Key Specifications and Features:

1. Enhanced Automation: AMBER 2 features fully automated processes, reducing user intervention and increasing efficiency. It supports overnight operations, allowing labs to boost productivity by performing routine sample preparations without manual oversight.

2. User Interface: The system includes an intuitive interface designed for both novice and experienced users, simplifying complex procedures.

3. Sample Preparation and Imaging: The AMBER 2 maintains high resolution and accuracy in sample preparation, with an improved detection system for materials surface characterization. It ensures precise sample preparation through its ultra-high-resolution SEM and advanced Ga+ FIB.

4. Prototyping Capabilities: The integration of a beam blanker on the BrightBeam™ SEM column enhances nanoprototyping, including electron beam lithography. This expands the capabilities for prototyping applications significantly.

5. AI-Driven Technology: Leveraging AI and an extensive material library, the AMBER 2 ensures reliable and fully automated sample preparation across various materials. This feature guarantees consistent and repeatable results.

6. Additional Tools: Alongside AMBER 2, TESCAN has introduced the AURA Gentle Ion Beam system, which minimizes gallium FIB-induced damage in TEM specimen preparation, and the TEM AutoPrep Pro™ software, automating and optimizing the entire TEM sample preparation process.

Applications and Benefits:

The AMBER 2 is designed for use in materials nanocharacterization, surface characterization, and nanoprototyping. Its advanced automation capabilities allow labs to increase throughput and efficiency, making it an ideal choice for high-demand environments.