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Panalytical Axios Advanced

The Panalytical Axios Advanced is a cutting-edge wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer that excels in elemental analysis. With the ability to measure all the elements between beryllium and uranium, it ensures precise identification and quantification of elements in various samples. The instrument's impressive detection limits enable accurate analysis of trace elements. Featuring a user-friendly interface and rapid analysis capabilities, the Axios Advanced optimizes efficiency in industries requiring quantifiable elemental analysis, such as metals, minerals, and environmental monitoring.

The Axios Advanced is engineered for excellence in terms of analytical and operational performance. Technological innovation combined with decades of experience has resulted in the ultimate system for accurate and precise XRF analysis.

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