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Netzsch LFA 447 NanoFlash

Determination of thermophysical properties is quick, easy and cost-effective with the new LFA 447 NanoFlash® Light Flash System. A high-performance Xenon flash lamp takes the place of the laser, which is usually employed for this proven technique. With the integrated sample changer for 4 samples, it is possible to run measurements on several samples automatically. The easily-accessible sample carrier allows short setting periods for test preparation and a high through-put of samples. Unique is the optional scanning device (MTX) for flat samples up to 50 mm x 50 mm for determining differences in the thermal diffusivity over the entire sample surface with a spatial resolution of 100 µm in the x and y directions.
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