JEOL JSM-7800F

The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for imaging and analysis. JEOL's highest performance FE-SEM makes it possible to:   

• Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution   
• Collect large area EBSD maps at low magnifications without distortion   
• Perform low kV imaging and analysis of highly magnetic samples.   
• Image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector