JEOL JCM-6000 NeoScope

The NeoScope II is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X - 60,000X. It offers high & low vacuum operation, three selectable accelerating voltages, secondary electron, and back-scattered electron imaging. The NeoScope II accommodates samples up to 70mm in diameter and 50mm in thickness. The NeoScope examines both conductive and non-conductive samples without any special sample preparation. Optional EDS is available for elemental analysis.